As technologies evolve to meet demand for next generation products and systems, the ability to perform testing and monitoring on these systems must advance too. Vector signal generators (abbreviated VSG and sometimes referred to as digital signal generators) have become an increasingly significant tool in the testing and measuring field due to the increasing complexity of waveforms. The growing complexity of radio, wireless, and cellular technologies depends on signals that cannot be produced by the pulse and signal generators of the past. Technologies such as WiFi, GPS, LTE, and many more have become mainstays in everyday life and, because of this, the ability to produce these unique and complex waveforms has become imperative to the testing and measuring industry.
An important tool in signal measuring is tracking correlation. Using an oscilloscope and checking for correlation in a wavelength, you can parse out a signal from noise, compare frequency of two signals, measure delay between two signals – the tracking and subsequent application of correlation measurement is nearly endless. In this oscilloscope tutorial, we’re going to run you through the process of measuring correlation with an oscilloscope.
Today, we’ll be discussing different types of transistors – how far they have come and the pros and cons of each. Lumped into two large categories, transistors are either electromechanical or solid state, the older of the two being electromechanical.
MIMO (Multiple Input, Multiple Output) is a critical component of wireless communication standards. It’s a practical technique for sending and receiving more than one data signal on the same radio channel at the same time via multipath propagation. Multiple antenna systems, known as MIMO systems, boost data throughput without requiring additional bandwidth or transmit power.
LTE (long term evolution) is quickly becoming the single global standard for cellular communications. As such, telecommunication vendors and operators are working hard to accelerate the availability of commercial and interoperable LTE networks and devices through a global collaboration called the LTE/SAE Trial Initiative (LSTI). Consumer demand for mobile devices continues to rise for devices with both voice and extensive data capabilities. As these new devices are designed and manufactured, the demand and complexity for LTE testing will increase significantly.
As cell phones advance and demands on cell phone batteries increase, engineers are constantly looking to reduce the power consumption of new technology. Specifically, engineers are seeking to reduce the power consumption of the RF power amplifier (PA). One way to optimize the power-added efficiency (PAE) of the PA is through envelope tracking.
You want top-tier technology, but not top-tier pricing. You’re look for a deal, but you’re also looking for reliability. With these two thoughts repeating in your mind, you debate whether or not you should buy aged test equipment.
Fine-tuned test equipment provides the most accurate test results in cases of default product modes or specific requirements for a customer. Even with industry leading test equipment why are regular calibrations essential?
People expect their technology to do more and more. This, in turn, makes the electrical components of new products even more complex requiring extensive testing and troubleshooting. Newly released products must now pass tighter testing regulations, be available to the public more quickly, and exhibit top quality.