Test equipment Tester Test Testing Equipment "" Tested Testing equipment
test equipment
test equipment
Test Equipment Products
 Logic Analyzers
 Network Analyzers
 Oscilloscopes
 Signal/Spectrum Analyzers
 Signal Generators
 Wireless Communications

Manufacturers
 Agilent (HP)
 Dranetz-BMI
 Fluke Networks
 QuadTech
 Rohde & Schwarz
 Spirent (TAS)
 Tektronix

New and used
test equipment
rental and sales including:
oscilloscopes
network analyzers
spectrum analyzers
and other electronic
testing equipment from:
Tektronix
Agilent
Fluke
QuadTech,
Rohde and Schwarz
among other respected
tested manufacturers.

Tektronix AWG610 Arbitrary Waveform Generator
TEKAWG610
As a premier member of the Tektronix family of arbitrary generators, the AWG 610 is an easy-to-use, high performance, flag-ship product. The AWG 610 provides the world’s fastest and deepest memory with its 2.6 GS/s sample clock rate and 8 Mega-points of execution memory. The AWG 610 provides up to 2 V output or 4 V into a differential input with the complementary output with 460 MHz bandwidth at normal mode (1 V output or 2 V into differential input with the complementary output with 875 MHz bandwidth at direct out), each with 8-Bits vertical resolution. The AWG 610 also provides 2-channels complementary 2.5 V variable marker (Tr/Tf : <150 ps @ 2 Vp-p) data 100 ps deskew resolution at up to 2.6 GHz.
CLICK HERE
add to cart
FOR A FREE QUOTE
Features & Benefits
  • 2.6 GS/s Sample Rate to Test High-speed Devices and Subsystem
  • 1 Analog and 2 Digital Output Markers to Produce Complex Mixed Analog and Digital Signals
  • 8 M Point Record Length for Long Signal Playtimes
  • 8-bit Vertical Resolution for Precise Signal Replication
  • Analog Bandwidth to Over 800 MHz
  • EZ Function Generator Mode Allows Quick Creation and Edit of Sine, Square, Triangle, Ramp, Pulse and DC Waveforms
  • Waveform Quick Editor with up to 400 fs Edge Timing Resolution Delivers Output Edge Control with Greater Timing Precision
  • Real-time Sequencing Creates Infinite Waveform Loops, Jumps, Patterns and Conditional Branches
  • Built-in Read Channel and Data Pattern Editing Capability
  • GPIB and LAN (10Base-T) Interfaces
  • Built-in Hard Drive for Mass Data Storage
Applications
  • Disk Drive Read/Write Design and Test
    – Head
    – Pre-amplifier
    – Read/Write
    – Servo Test

  • Communications Design and Test
    – Standard Waveforms for Communications

  • Pulse Generation
    – Duty Cycle Ranges from 0% to 100% for NRZ Data
    – Testing Clock/Gating Width Variations

  • Mixed Signal Design and Test

  • Real-world Simulations
    – Corruption and Enhancement of Ideal Waveforms
    – Timing and Amplitude Signal Impairments
    – Jitter Profiles
    – Waveforms Imported from GPIB, Floppy Disk, 10Base-T Ethernet, DSO or DPO

 

 

 

For more information call us toll free 800-937-4688 (option 2) or
Contact Us Form

 

Privacy | Terms & Conditions  © 2007 Continental Resources, Inc. All rights reserved.