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New! Tektronix DSA8200 Digital Serial Analyzer
Sampling Oscilloscopes


The DSA8200 digital serial analyzer sampling oscilloscope is your time- and cost-effective choice for signal path characterization. As the leader in the market for TDR-based solutions, the DSA8200 gives you the greatest performance for serial data network analysis applications - TDR performance, S-parameter bandwidth, signal fidelity, and RMS noise. And as the leader, it also gives you the versatility for characterization and conformance testing of emerging high-speed computer and communications electrical and optical signals.

The DSA8200 is the industry’s most versatile TDR measurement system, accommodating up to 4 dual channel true differential TDR modules for fast accurate multi-lane impedance characterization.

 

Tektronix DSA8200 Digital Serial Analyzer Sampling Oscilloscope

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Superior Performance with Extraordinary Versatility

The DSA8200 provides unmatched measurement system fidelity with ultra-low jitter floor that ensures the most accurate acquisition of high-speed signals. You get advanced analysis benefits from the 200 fs acquisition jitter with the Phase Reference module. The multi-processor architecture, with dedicated per-slot digital signal processors (DSPs), provides fast waveform acquisition rates, reducing the test times necessary for reliable characterization and compliance verification.

The DSA8200’s versatile modular architecture supports a large and growing family of plug-ins enabling you to configure your measurement system with a wide variety of electrical, optical, and accessory modules that best suit your application now and in the future. With 6 module slots, the DSA8200 can simultaneously accommodate a clock recovery module, a precision Phase Reference module, and multiple acquisition modules, electrical or optical, so you can match system performance to your evolving needs.

 Features and Benefits:

State of the art Communication Signal Analysis:

  • Fully Integrated Multi-rate Optical Modules
  • Electrical Modules to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%)*1
  • Flexible Rate Clock Recovery
  • Automated ITU/ANSI/IEEE Mask Testing
  • Masks and Measurements for SONET/SDH, FC, Ethernet and Other Standards Built-in
  • Mask Margin Testing for Guard Banding Production Testing
  • Automated Communication Measurements
  • NRZ, Pulse, RZ
  • Extinction Ratio (ER), Optical Modulation Amplitude (OMA), and Over 100 Other Measurements
  • Four Color Graded, Variable Persistence Waveform Databases

Jitter, Noise and BER Analysis

  • Measures and Separates Deterministic Data Dependent Jitter from Random Jitter
  • Measures Vertical Noise Separating Deterministic Data Dependent Noise from Random Noise
  • Highly Accurate BER and Eye Contour Estimation

TDR (Time Domain Reflectometry)

  • Up to 50 GHz TDR Bandwidth with 15 ps Reflected Rise Time and 12 ps Incident Rise Time
  • Lowest Noise for Accurate Repeatable TDR Measurement Results – 600 μVRMS at 50 GHz
  • Independent Sampler Deskew Ensures Easy Fixture and Probe De-embedding
  • Industry’s Only Mainframe to Accommodate up to Four True Differential TDR or Electrical Channel Pairs for Increased System Versatility

S-parameters Measurements

  • Up to 50 GHz Differential, Single Ended, Mixed-Mode; Insertion, Return Loss, Frequency Domain Crosstalk
  • PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests
  • Intuitive, Easy and Accurate for Serial Data, Gigabit Digital Design and Signal Integrity
  • Fast and Accurate Automated Multi-port S-parameter Measurements with Command Line Interface

Modular Architecture

  • Wide range of Optical and Electrical Standards Supported
  • Industry’s Only Mainframe to Support up to 8 Input Channels, Reducing Time and Cost per Test

Other Features:

  • Industry’s Best Standard Timebase Jitter Performance, 800 fsRMS
  • Industry Leading Timebase Jitter Performance, <200 fsRMS*2 Available with Phase Reference Mode
  • Fast- Acquisition Rate and High Throughput
  • True Differential Remote Sampler Enabling Placement Near DUT for Superior Signal Fidelity
  • FrameScan™ Acquisition Mode with Eye Diagram Averaging:
    • Isolate Data Dependent Faults
    • Examine Low-power Signals
  • MS Windows XP Operating System
  • Advanced Connectivity to 3rd party software
 Applications:
  • Design/Verification of Telecom and Datacom Components and Systems
  • Manufacturing/Testing for ITU/ANSI/IEEE/SONET/SDH Conformance
  • High-Performance True Differential TDR Measurements
  • Advanced Jitter, Noise, and BER Analysis
  • Impedance Characterization and Network Analysis for Serial Data Applications Including S-parameters
  • Channel and Eye diagram Simulation and Measurement-based SPICE Modeling

*1 Bandwidth is determined by plug-in modules and may exceed 70 GHz as higher speed modules become available in the future.

*2 Typical, with the Phase Reference Module, some conditions apply. Without the module, the jitter is <800 fsRMS (typical).


For information on DSA8200 Sampling Oscilloscopes - View Datasheet

DSA8200 Sampling Oscilloscopes Datasheet

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